- Atomic Force Microscope

The fastest measurement setup and largest sample stage, the Tosca series will keep up with your AFM nano surface analysis. Tosca is the first choice for researchers, pioneers, thinkers, and creators in nanotechnology material science.

Key Features

• Top-level AFM for entry-level budgets
• Biggest sample stage in price segment (50 mm fully addressable)
• Fastest time-to-measure on the market (only 3 min)
• Scan size of 15 μm in Z and 90 μm x 90 μm in X and Y direction
• Cantilever exchange in less than 10 seconds
• All modes on the same sample spot without head exchange