Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and get images with information about the samples’ topography and composition. CSEMs (conventional SEMs), FE-SEMs

(field emission SEMs) and ZEISS Crossbeam (FIB-SEMs) deliver high resolution imaging and superior materials contrast.

Applications of SEMs

• Materials science for research, quality control and failure analysis.
• Semiconductor inspection
• Forensic investigations for Criminal and others
• Biological sciences
• Automated Mineralogy Analyzer for Mineralogy and mining.